Strain-induced enhancement of the thermoelectric power in thin films of hole-doped La2NiO4+δ
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Abstract
We propose a novel route for optimizing the thermoelectric power of a polaronic conductor, independent of its electronic conductivity. This mechanism is exemplified here in thin-films of La2NiO4+δ. Tensile stress induced by epitaxial growth on SrTiO3 doubles the thermoelectric power of ≈15 nm thick films relative to ≈90 nm films, while the electronic conductivity remains practically unchanged. Epitaxial strain influences the statistical contribution to the high temperature thermopower, but introduces a smaller correction to the electronic conductivity. This mechanism provides a new way for optimizing the high temperature thermoelectric performance of polaronic conductors
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Bach, P., Vila-Fungueiriño, J., Leborán, V., Ferreiro-Vila, E., Rodríguez-González, B., & Rivadulla, F. (2013). Strain-induced enhancement of the thermoelectric power in thin films of hole-doped La2NiO4+δ. APL Materials, 1(2), 021101. doi: 10.1063/1.4818356
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https://doi.org/10.1063/1.4818356Sponsors
This work was supported by the European Research Council (ERC StG-259082, 2DTHERMS), and Ministerio de Economía y Competitividad of Spain through the project MAT2010-16157, and a Ph.D. grant of the FPI program (J.M.V.-F.)
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© 2013 The Author(s). Published by AIP Publishing. This work is is licensed under a Creative Commons Attribution 3.0 Unported License








