Lai, WeienCao, HaibingYang, JunDeng, GuangshengYin, ZhipingZhang, QianPelaz García, BeatrizPino González de la Higuera, Pablo Alfonso del2019-09-112019-09-112018Lai, W., Cao, H., Yang, J., Deng, G., Yin, Z., & Zhang, Q. et al. (2018). Antireflection self-reference method based on ultrathin metallic nanofilms for improving terahertz reflection spectroscopy. Optics Express, 26(15), 19470. doi: 10.1364/oe.26.0194701094-4087http://hdl.handle.net/10347/19754We present the potential of an antireflection self-reference method based on ultrathin tantalum nitride (TaN) nanofilms for improving terahertz (THz) reflection spectroscopy. The antireflection self-reference method is proposed to eliminate mutual interference caused by unwanted reflections, which significantly interferes with the important reflection from the actual sample in THz reflection measurement. The antireflection self-reference model was investigated using a wave-impedance matching approach, and the theoretical model was verified in experimental studies. We experimentally demonstrated this antireflection selfreference method can completely eliminate the effect of mutual interference, accurately recover the actual sample’s reflection and improve THz reflection spectroscopy. Our method paves the way to implement a straightforward, accurate and efficient approach to investigate THz properties of the liquids and biological sampleseng© 2018 Optical Society of America under the terms of the OSA Open Access Publishing AgreementAntireflection coatingsSpectroscopyTerahertzjournal article10.1364/OE.26.019470open access