Antireflection self-reference method based on ultrathin metallic nanofilms for improving terahertz reflection spectroscopy

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dc.contributor.affiliationUniversidade de Santiago de Compostela. Centro de Investigación en Química Biolóxica e Materiais Molecularesgl
dc.contributor.affiliationUniversidade de Santiago de Compostela. Departamento de Física da Materia Condensadagl
dc.contributor.authorLai, Weien
dc.contributor.authorCao, Haibing
dc.contributor.authorYang, Jun
dc.contributor.authorDeng, Guangsheng
dc.contributor.authorYin, Zhiping
dc.contributor.authorZhang, Qian
dc.contributor.authorPelaz García, Beatriz
dc.contributor.authorPino González de la Higuera, Pablo Alfonso del
dc.date.accessioned2019-09-11T07:54:26Z
dc.date.available2019-09-11T07:54:26Z
dc.date.issued2018
dc.description.abstractWe present the potential of an antireflection self-reference method based on ultrathin tantalum nitride (TaN) nanofilms for improving terahertz (THz) reflection spectroscopy. The antireflection self-reference method is proposed to eliminate mutual interference caused by unwanted reflections, which significantly interferes with the important reflection from the actual sample in THz reflection measurement. The antireflection self-reference model was investigated using a wave-impedance matching approach, and the theoretical model was verified in experimental studies. We experimentally demonstrated this antireflection selfreference method can completely eliminate the effect of mutual interference, accurately recover the actual sample’s reflection and improve THz reflection spectroscopy. Our method paves the way to implement a straightforward, accurate and efficient approach to investigate THz properties of the liquids and biological samplesgl
dc.description.peerreviewedSIgl
dc.description.sponsorshipThe Fund from Hefei University of Technology (407-0371000019); Sichuan Province Science and Technology Support Program (No. 2016GZ0250); the Fundamental Research Funds for the Central Universities (Grant No. JD2017JGPY0006); National Natural Science Foundation of China (Grant No.51607050); MINECO (MAT2015–74381-JIN to B.P., RYC2014–16962 and CTQ2017-89588-R to P.dP.); Xunta de Galicia (Centro singular de investigación de Galicia accreditation 2016–2019, ED431G/09); European Union (European Regional Development Fund – ERDF)gl
dc.identifier.citationLai, W., Cao, H., Yang, J., Deng, G., Yin, Z., & Zhang, Q. et al. (2018). Antireflection self-reference method based on ultrathin metallic nanofilms for improving terahertz reflection spectroscopy. Optics Express, 26(15), 19470. doi: 10.1364/oe.26.019470gl
dc.identifier.doi10.1364/OE.26.019470
dc.identifier.issn1094-4087
dc.identifier.urihttp://hdl.handle.net/10347/19754
dc.language.isoenggl
dc.publisherThe Optical Societygl
dc.relation.projectIDinfo:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2017-2020/CTQ2017-89588-R/ES/NANOCAPSULAS BIOMIMETICAS PARA LA ADMINISTRACION DIRIGIDA DE NANOMEDICINAS
dc.relation.publisherversionhttps://doi.org/10.1364/OE.26.019470gl
dc.rights© 2018 Optical Society of America under the terms of the OSA Open Access Publishing Agreementgl
dc.rights.accessRightsopen accessgl
dc.subjectAntireflection coatingsgl
dc.subjectSpectroscopygl
dc.subjectTerahertzgl
dc.titleAntireflection self-reference method based on ultrathin metallic nanofilms for improving terahertz reflection spectroscopygl
dc.typejournal articlegl
dc.type.hasVersionVoRgl
dspace.entity.typePublication
relation.isAuthorOfPublicationae6cfd5f-90ba-47e5-9d34-20c3361b7df3
relation.isAuthorOfPublication29d26acf-e713-4d9b-8cf2-8e9ed521f62b
relation.isAuthorOfPublication.latestForDiscoveryae6cfd5f-90ba-47e5-9d34-20c3361b7df3

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