Near- and Mid-Infrared Spectroscopy for the Rapid and Non-Destructive Analysis of Wheat Flour and Wheat-Based Products: A Review

Abstract

Wheat flour and its derivatives are staple foods worldwide, making their quality and safety essential for the food industry and consumers. Conventional analytical methods are often slow, costly, and destructive. In recent years, infrared spectroscopy, particularly near-infrared (NIR) and mid-infrared (MIR), has emerged as a rapid, cost-effective, and non-destructive alternative for wheat flour assessment. This review summarizes recent advances in applying these techniques to determine quality parameters, monitor functional properties, detect adulterants, verify authenticity, and evaluate contamination risks. The integration of spectroscopy with chemometric methods and machine learning has improved predictive accuracy and robustness, supporting real-time and in situ analysis. In addition, the use of calibration models, wavelength selection strategies, and deep learning approaches has further enhanced analytical performance. Overall, NIR and MIR spectroscopy stand out as key tools to optimize quality control and safety in wheat flour, contributing to fast, reliable, and sustainable analytical systems for the food industry.